Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs

Tyaginov, StanislavStanislavTyaginovEl-Sayed, Al-MoatasemAl-MoatasemEl-SayedMakarov, AlexanderAlexanderMakarovVaisman Chasin, AdrianAdrianVaisman ChasinArimura, HiroakiHiroakiArimuraVandemaele, MichielMichielVandemaeleJech, MarkusMarkusJechCapogreco, ElenaElenaCapogrecoWitters, LiesbethLiesbethWittersGrill, AlexanderAlexanderGrillDe Keersgieter, AnAnDe KeersgieterEneman, GeertGeertEnemanLinten, DimitriDimitriLintenKaczer, BenBenKaczer2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/34160Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETsProceedings paperhttps://ieeexplore.ieee.org/document/8993644