Jin, S.S.JinBender, HugoHugoBenderLi, X.X.LiDong, C.C.DongZhang, ZhengZhengZhang2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2653Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantationProceedings paper