In-depth investigation of 0.13 μm SOI MOSFETs for high-temperature applications

Kilchytska, V.V.KilchytskaDe Meyer, KristinKristinDe MeyerFlandre, D.D.Flandre2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9127In-depth investigation of 0.13 μm SOI MOSFETs for high-temperature applicationsProceedings paper