A comparison of intrinsic point defect properties in Si and Ge

Vanhellemont, J.J.VanhellemontSpiewak, P.P.SpiewakSueoka, K.K.SueokaSimoen, EddyEddySimoenRomandic, I.I.Romandic2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14720A comparison of intrinsic point defect properties in Si and GeProceedings paper