Technology impact on the low frequency noise of Si and Si/SiGe superlattice input-output FinFETs

Claeys, CorCorClaeysHellings, GeertGeertHellingsArimura, HiroakiHiroakiArimuraBertrand, KaoutarKaoutarBertrandRagnarsson, Lars-AkeLars-AkeRagnarssonDekkers, HaroldHaroldDekkersSchram, TomTomSchramLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchiSimoen, EddyEddySimoenBoudin, DimitriDimitriBoudinCetu, BogdanBogdanCetu2021-10-282021-10-282020https://imec-publications.be/handle/20.500.12860/34912Technology impact on the low frequency noise of Si and Si/SiGe superlattice input-output FinFETsProceedings paper