Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Lanza, MarioMarioLanzaSmets, QuentinQuentinSmetsHuyghebaert, CedricCedricHuyghebaertLi, Lain-JongLain-JongLi2022-01-272021-11-022022-01-272022-01-2720202041-1723WOS:000593978400004https://imec-publications.be/handle/20.500.12860/38365Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devicesEditorial material10.1038/s41467-020-19053-9WOS:000593978400004GRAPHENEMEDLINE:33173041