Defect-based compact modeling for RTN and BTI variability

Weckx, PieterPieterWeckxSimicic, MarkoMarkoSimicicNomoto, KazukiKazukiNomotoOno, MakotoMakotoOnoParvais, BertrandBertrandParvaisKaczer, BenBenKaczerRaghavan, PraveenPraveenRaghavanLinten, DimitriDimitriLintenSawada, KenKenSawadaAmmo, HiroakiHiroakiAmmoYamakawa, ShinyaShinyaYamakawaSpessot, AlessioAlessioSpessotVerkest, DiederikDiederikVerkestMocuta, AndaAndaMocuta2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29918Defect-based compact modeling for RTN and BTI variabilityProceedings paperhttp://ieeexplore.ieee.org/document/7936356/