Amat, EsteveEsteveAmatKauerauf, ThomasThomasKaueraufDegraeve, RobinRobinDegraeveDe Keersgieter, AnAnDe KeersgieterRodríguez, RosanaRosanaRodríguezNafría, MontseMontseNafríaAymerich, XavierXavierAymerichGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-1720091530-4388https://imec-publications.be/handle/20.500.12860/14895Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacksJournal article