Van Nieuwenhove, VincentVincentVan NieuwenhoveDe Beenhouwer, JanJanDe BeenhouwerDe Schryver, ThomasThomasDe SchryverVan Hoorebeke, LucLucVan HoorebekeSijbers, JanJanSijbers2021-10-242021-10-242017-011057-7149https://imec-publications.be/handle/20.500.12860/29722Data-driven affine deformation estimation and correction in cone beam computed tomographyJournal articlehttp://ieeexplore.ieee.org/document/7819548/?reload=true