Vanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenBosman, GijsGijsBosmanClaeys, CorCorClaeysKaniava, ArvydasArvydasKaniavaGaubas, EugenijusEugenijusGaubasBlondeel, A.A.BlondeelClauws, P.P.Clauws2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/428On the electrical activity of oxygen-related extended defects in siliconProceedings paper