Pantisano, LuigiLuigiPantisanoLucci, L.L.LucciCartier, EdEdCartierKerber, AndreasAndreasKerberGroeseneken, GuidoGuidoGroesenekenGreen, M.M.GreenSelmi, L.L.Selmi2021-10-152021-10-152004-05https://imec-publications.be/handle/20.500.12860/9389Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacksJournal article