Lorenzini, MartinoMartinoLorenziniHaspeslagh, LucLucHaspeslaghVan Houdt, JanJanVan HoudtMaes, HermanHermanMaes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5456Simulation of 0.35 μm / 0.25 μm CMOS technology doping profilesJournal article