An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies

Diouf, C.C.DioufCros, A.A.CrosMonfray, S.S.MonfrayMitard, JeromeJeromeMitardRosa, J.J.RosaGloria, D.D.GloriaGhibaudo, G.G.Ghibaudo2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20614An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologiesProceedings paper