Alamarguy, DavidDavidAlamarguyAureau, DamienDamienAureauConard, ThierryThierryConardGauthier, NicolasNicolasGauthierGeorgi, FredericFredericGeorgiGuilet, StephaneStephaneGuiletHajjar-Garreau, SamarSamarHajjar-GarreauHeintz, OlivierOlivierHeintzMonier, GuillaumeGuillaumeMonierMethivier, ChristopheChristopheMethivierMontigaud, HerveHerveMontigaudSoule, SamanthaSamanthaSouleRenault, OlivierOlivierRenaultLazzari, RemiRemiLazzari2025-03-242024-09-302025-03-2420240368-2048WOS:001317990800001https://imec-publications.be/handle/20.500.12860/44591Intensity-energy response function of Al/Cr-Ka x-ray photoemission instruments: An inter-laboratory studyJournal article10.1016/j.elspec.2024.147486WOS:001317990800001PHOTOELECTRON ANGULAR-DISTRIBUTIONFREE PATHS IMFPSSURFACE EXCITATION PARAMETERQUANTITATIVE-ANALYSISRANGESPECTRASOLIDSXPSPHOTOIONIZATIONQUANTIFICATION