Gaur, AbhinavAbhinavGaurChiappe, DanieleDanieleChiappeLin, DennisDennisLinCott, DaireDaireCottAsselberghs, IngeIngeAsselberghsHeyns, MarcMarcHeynsRadu, IulianaIulianaRadu2021-10-272021-10-2720192053-1583https://imec-publications.be/handle/20.500.12860/33017Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2Journal articlehttps://doi.org/10.1088/2053-1583/ab20fb