A lock-in approach for photo-conductivity based lifetime measurement

Cornagliotti, EmanueleEmanueleCornagliottiAgostinelli, GuidoGuidoAgostinelliBeaucarne, GuyGuyBeaucarnePoortmans, JefJefPoortmans2021-10-162021-10-162007-09https://imec-publications.be/handle/20.500.12860/11904A lock-in approach for photo-conductivity based lifetime measurementProceedings paper