Makarov, AlexanderAlexanderMakarovKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselVaisman Chasin, AdrianAdrianVaisman ChasinVandemaele, MichielMichielVandemaeleHellings, GeertGeertHellingsEl-Sayed, Al-MoatasemAl-MoatasemEl-SayedJech, MarkusMarkusJechGrasser, TiborTiborGrasserLinten, DimitriDimitriLintenTyaginov, StanislavStanislavTyaginov2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33512Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopantsProceedings paperhttps://ieeexplore.ieee.org/document/8901721