De Wolf, PeterPeterDe WolfGeva, M.M.GevaReynolds, C. L.C. L.ReynoldsHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorstBylsma, R. B.R. B.Bylsma2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3390Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopyJournal article