Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

Kukner, HalilHalilKuknerKhatib, MoustafaMoustafaKhatibMorrison, SebastienSebastienMorrisonWeckx, PieterPieterWeckxRaghavan, PraveenPraveenRaghavanKaczer, BenBenKaczerCatthoor, FranckyFranckyCatthoorVan der Perre, LiesbetLiesbetVan der PerreLauwereins, RudyRudyLauwereinsGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24074Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technologyProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6783362