Brammertz, GuyGuyBrammertzLin, H.C.H.C.LinMartens, KoenKoenMartensMerckling, ClementClementMercklingPenaud, J.J.PenaudAlian, AliRezaAliRezaAlianSioncke, SonjaSonjaSionckeWang, Wei-EWei-EWangMeuris, MarcMarcMeurisCaymax, MattyMattyCaymaxHeyns, MarcMarcHeyns2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13446Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfacesMeeting abstract