Beyond-Cu Intermediate-Length Interconnect Exploration for SRAM Application

Pei, ZhenlinZhenlinPeiCatthoor, FranckyFranckyCatthoorTokei, ZsoltZsoltTokeiPan, ChenyunChenyunPan2022-08-312022-08-092022-08-142022-08-3120221536-125XWOS:000833748000002https://imec-publications.be/handle/20.500.12860/40235Beyond-Cu Intermediate-Length Interconnect Exploration for SRAM ApplicationJournal article10.1109/TNANO.2022.3157952WOS:000833748000002TECHNOLOGYGRAPHENEMULTIGATEIntermediate-Length Interconnect Exploration, SRAM