A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity

Manfredi, PaoloPaoloManfrediWu, XinglongXinglongWuGrassi, FlaviaFlaviaGrassiVande Ginste, DriesDriesVande GinstePignari, Sergio A.Sergio A.Pignari2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28907A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformityProceedings paperhttp://ieeexplore.ieee.org/document/7944000/