A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs

Vasina, PetrPetrVasinaSimoen, EddyEddySimoenClaeys, CorCorClaeysSikula, J.J.Sikula2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/3106A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETsJournal article