Rafi, J.M.J.M.RafiCardona-Safont, L.L.Cardona-SafontZabala, M.M.ZabalaBoulord, C.C.BoulordCampabadal, F.F.CampabadalPellegrini, G.G.PellegriniLozano, M.M.LozanoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14352Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectorsProceedings paper