Identification of nickel-vacancy defects by combining experimental and ab initio simulated photocurrent spectra

Londero, E.E.LonderoBourgeois, EmilieEmilieBourgeoisNesladek, MilosMilosNesladekGalli, A.A.Galli2021-10-252021-10-2520181098-0121https://imec-publications.be/handle/20.500.12860/31226Identification of nickel-vacancy defects by combining experimental and ab initio simulated photocurrent spectraJournal articlehttps://doi.org/10.1103/PhysRevB.97.241202