Ohyama, H.H.OhyamaTakakura, K.K.TakakuraUemura, K.K.UemuraShigaki, K.K.ShigakiKudou, T.T.KudouMatsumoto, T.T.MatsumotoArai, M.M.AraiKuboyama, S.S.KuboyamaKamezawa, C.C.KamezawaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-1720080957-4522https://imec-publications.be/handle/20.500.12860/14245Degradation of SiC-MESFETs by irradiationJournal article