Toledano-Luque, MariaMariaToledano-LuqueDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroesenekenZahid, MohammedMohammedZahidPantisano, LuigiLuigiPantisanoDegraeve, RobinRobinDegraeveSan Andres, EnriqueEnriqueSan Andres2021-10-172021-10-1720080018-9383https://imec-publications.be/handle/20.500.12860/14567New developments in charge pumping measurements on thin stacked dielectricsJournal article