Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide

Sun, XiaoXiaoSunMerckling, ClementClementMercklingBrammertz, GuyGuyBrammertzLin, DennisDennisLinDekoster, JohanJohanDekosterCui, SharinSharinCuiMa, T. P.T. P.Ma2021-10-202021-10-2020120021-8979https://imec-publications.be/handle/20.500.12860/21572Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitorsJournal article