3D IC analysis using magnetic field imaging

Gaudestad, JanJanGaudestadOrozco, A.A.OrozcoDe Wolf, IngridIngridDe WolfJeffers, A.A.JeffersCheng, B.B.ChengWellstood, F.C.F.C.Wellstood2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/223773D IC analysis using magnetic field imagingMeeting abstract