On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistors

Lukyanchikova, N.N.LukyanchikovaPetrichuk, M.M.PetrichukGarbar, N.N.GarbarSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchavan Meer, HansHansvan MeerDe Meyer, KristinKristinDe MeyerClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6561On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistorsProceedings paper