Fatermans, J.J.Fatermansden Dekker, Arnold JanArnold Janden DekkerMüller-Caspary, K.K.Müller-CasparyLobato, I.I.LobatoVan Aert, S.S.Van Aert2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30693Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detectionMeeting abstracthttps://issuu.com/dtudanchipcen/docs/scandem_book_of_abstracts_25_june_2