Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices

Bellens, RudiRudiBellensHabas, PredragPredragHabasGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaesMieville, Jean-PaulJean-PaulMievilleVan den bosch, G.G.Van den boschDeferm, LudoLudoDeferm2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/518Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devicesProceedings paper