Torres-Torres, ReydezelReydezelTorres-TorresMurphy-Arteaga, R.S.R.S.Murphy-ArteagaDecoutere, StefaanStefaanDecoutere2021-10-152021-10-152003-10https://imec-publications.be/handle/20.500.12860/8221MOSFET bias dependent series resistance extraction from RF measurementsJournal article