Zhang, J.J.ZhangZhao, C.D.C.D.ZhaoGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveEllis, J. N.J. N.EllisBeech, C. D.C. D.Beech2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5870Relation between hole traps and non-reactive hydrogen induced positive chargesJournal article