1/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnections

Beyne, SofieSofieBeyneCroes, KristofKristofCroesDe Wolf, IngridIngridDe WolfTokei, ZsoltZsoltTokei2021-10-232021-10-2320160021-8979https://imec-publications.be/handle/20.500.12860/263401/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnectionsJournal articlehttp://scitation.aip.org/content/aip/journal/jap/119/18/10.1063/1.4947582