Cester, A.A.CesterGerardin, S.S.GerardinPaccagnella, A.A.PaccagnellaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10203Electrical stresses on ultra-thin gate oxide SOI MOSFETs after irradiationJournal article