The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's

Degraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenDe Wolf, IngridIngridDe WolfMaes, HermanHermanMaes2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1839The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET'sJournal article