McNally, P. J.P. J.McNallyO'Hare, M.M.O'HareTuomi, T.T.TuomiRantamaki, R.R.RantamakiJacobs, KoenKoenJacobsConsidine, L.L.ConsidineDanilewsky, A. N.A. N.Danilewsky2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3666Synchrotron x-ray topography studies of epitaxial laterial overgrowth of GaN on sapphireProceedings paper