New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405

Marinissen, Erik JanErik JanMarinissenEvans, AdrianAdrianEvansChuang, Po-YaoPo-YaoChuangKeim, MartinMartinKeimChandra, AnshumanAnshumanChandra2025-08-252024-08-232025-08-252024979-8-3503-4933-71530-1877WOS:001260970400022https://imec-publications.be/handle/20.500.12860/44360New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405Proceedings paper10.1109/ETS61313.2024.10567355979-8-3503-4932-0WOS:001260970400022