Liu, RuiRuiLiuSchreurs, DominiqueDominiqueSchreursDe Raedt, WalterWalterDe RaedtVanaverbeke, FreFreVanaverbekeDas, JoJoDasMertens, RobertRobertMertensDe Wolf, IngridIngridDe Wolf2021-10-192021-10-1920110026-2714https://imec-publications.be/handle/20.500.12860/19314Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technologyJournal article