Kummer, K.K.KummerFondacaro, A.A.FondacaroYakhou-Harris, F.F.Yakhou-HarrisSessi, V.V.SessiPobedinskas, PauliusPauliusPobedinskasJanssens, StoffelStoffelJanssensHaenen, KenKenHaenenWilliams, O.A.O.A.WilliamsHees, J.J.HeesBrookes, N.B.N.B.Brookes2021-10-212021-10-2120130034-6748https://imec-publications.be/handle/20.500.12860/22624Thin conductive diamond films as beam intensity monitors for soft x-ray beamlinesJournal article10.1063/1 4794439