Time dependent dielectric breakdown study of organo silicate glass materials over a wide range of k-values

Barbarin, YohanYohanBarbarinZhao, LarryLarryZhaoVerdonck, PatrickPatrickVerdonckBaklanov, MikhaïlMikhaïlBaklanovCroes, KristofKristofCroesTokei, ZsoltZsoltTokei2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20342Time dependent dielectric breakdown study of organo silicate glass materials over a wide range of k-valuesProceedings paper