Yadav, SachinSachinYadavVais, AbhitoshAbhitoshVaisElKashlan, Rana Y.Rana Y.ElKashlanWitters, LiesbethLiesbethWittersVondkar Kodandarama, KomalKomalVondkar KodandaramaMols, YvesYvesMolsWalke, AmeyAmeyWalkeYu, HaoHaoYuAlcotte, ReynaldReynaldAlcotteIngels, MarkMarkIngelsWambacq, PietPietWambacqLanger, RobertRobertLangerKunert, BernardetteBernardetteKunertWaldron, NiamhNiamhWaldronParvais, BertrandBertrandParvaisCollaert, NadineNadineCollaert2022-01-282021-11-022022-01-282021naWOS:000654861200023https://imec-publications.be/handle/20.500.12860/37896DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si SubstratesProceedings paper978-2-87487-060-6WOS:000654861200023