Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

Degraeve, RobinRobinDegraeveZahid, MohammedMohammedZahidVan den Bosch, GeertGeertVan den BoschBlomme, PieterPieterBlommeBreuil, LaurentLaurentBreuilKaczer, BenBenKaczerMercuri, MarcoMarcoMercuriRothschild, AudeAudeRothschildCacciato, AntonioAntonioCacciatoJurczak, GosiaGosiaJurczakGroeseneken, GuidoGuidoGroesenekenVan Houdt, JanJanVan Houdt2021-10-172021-10-172009-10https://imec-publications.be/handle/20.500.12860/15212Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization techniqueProceedings paper