Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

Verspecht, J.J.VerspechtDebie, PeterPeterDebieBarel, A.A.BarelMartens, LucLucMartens2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/1000Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave deviceProceedings paper