On the correlation between static and low-frequency noise parameters of vertical nanowire nMOSFETs

Simoen, EddyEddySimoenVaisman Chasin, AdrianAdrianVaisman ChasinMatagne, PhilippePhilippeMatagneRosseel, ErikErikRosseelHikavyy, AndriyAndriyHikavyyLoo, RogerRogerLooFavia, PaolaPaolaFaviaBender, HugoHugoBenderVancoille, EricEricVancoilleVeloso, AnabelaAnabelaVeloso2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35949On the correlation between static and low-frequency noise parameters of vertical nanowire nMOSFETsProceedings paperhttps://doi.org/10.1149/09705.0059ecst