Raskin, Jean-PierreJean-PierreRaskinPailloncy, GuillaumeGuillaumePailloncyLederer, DimitriDimitriLedererDanneville, FrancoisFrancoisDannevilleDambrine, GillesGillesDambrineDecoutere, StefaanStefaanDecoutereMercha, AbdelkarimAbdelkarimMerchaParvais, BertrandBertrandParvais2021-10-172021-10-1720080018-9383https://imec-publications.be/handle/20.500.12860/14361High-frequency noise performance of 60-nm gate-length FinFETsJournal article