Claeys, CorCorClaeysSimoen, EddyEddySimoenAgopian, PaulaPaulaAgopianMartino, J.A.J.A.MartinoAoulaiche, MarcMarcAoulaicheCretu, BogdanBogdanCretuVandooren, AnneAnneVandoorenRooyackers, RitaRitaRooyackersVeloso, AnabelaAnabelaVelosoJurczak, GosiaGosiaJurczakCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25085The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devicesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7298104