Pinel, S.S.PinelMarty, A.A.MartyTasselli, J.J.TasselliBailbe, J. P.J. P.BailbeBeyne, EricEricBeyneVan Hoof, RitaRitaVan HoofMarco, S.S.MarcoMorante, J. R.J. R.MoranteVendier, O.O.VendierHuan, M.M.Huan2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6725Thermal modeling and management in ultrathin chip stack technologyJournal article