Zhang, E.X.E.X.ZhangSamsel, I.K.I.K.SamselBennett, W.G.W.G.BennettHooten, N.C.N.C.HootenMcCurdy, M.M.McCurdyFleetwood, D.M.D.M.FleetwoodReed, R.A.R.A.ReedAlles, M.L.M.L.AllesSchrimpf, R.D.R.D.SchrimpfWeller, R.A.R.A.WellerLinten, DimitriDimitriLintenMitard, JeromeJeromeMitard2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23437Heavy ion and laser-induced transients in SiGe channel pMOSFETsProceedings paper